-
Effects of focused ion beam milling on the compressive behavior of directionally solidified micropillars and the nanoindentation response of an electropolished surface
S. Shima, b, H. Beia, M.K. Millera, G.M. Pharra, b and E.P. Georgea, b
aMaterials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN 37831, USA bDepartment of Materials Science and Engineering, The University of Tennessee, Knoxville, TN 37996, USA
Received 11 August 2008;revised 18 September 2008;accepted 24 September 2008.Available online 18 October 2008.Abstract
Focused ion beam (FIB) milling is the typical method used to fabricate micropillars to study small-scale plasticity and size effects in uniaxial compression. However, FIB milling can introduce defects into the milled pillars. To investigate the effects of FIB damage on mechanical behavior, we tested Mo-alloy micropillars that were FIB milled following directional solidification, and compared their compressive response to pillars that were not FIB milled. We also FIB milled at glancing incidence a Mo-alloy single-crystal surface, and compared its nanoindentation response to an electropolished surface of the same crystal. Implications for the interpretation of data obtained from FIB-milled micropillars are discussed.
Keywords: Nanoindentation; Compression test; Yield phenomena; Plastic deformation; Focused ion beam (FIB) damage
-
1.Effects of pre-strain on the compressive stress–strain response of Mo-alloy single-crystal micropillars
Pages 4762-4770
H. Bei, S. Shim, G.M. Pharr and E.P. George2.Sample shape and temperature strongly influence the yield strength of metallic nanopillars
Pages 4816-4828
Ajing Cao and E. Ma3.Void formation in nanocrystalline Cu film during uniaxial relaxation test
Pages 4921-4931
Junya Inoue, Yosuke Fujii and Toshihiko Koseki
共1页 1
